4

Year:
2008
Language:
english
File:
PDF, 314 KB
english, 2008
13

A test pattern generation method with high compression ratio

Year:
2011
Language:
english
File:
PDF, 653 KB
english, 2011
14

A low cost test pattern generator for test-per-clock BIST scheme

Year:
2010
Language:
english
File:
PDF, 246 KB
english, 2010
17

A Low Power Test Pattern Generator for BIST

Year:
2010
Language:
english
File:
PDF, 1.01 MB
english, 2010